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SM30355 IE200M series Metallurgical Microscope

 

■ Professional metallurgical objective and plan eyepiece provide clear image, high
   resolution, comfortable observation
■ Superior image and reliable mechanical structure.
■ With the corresponding photo or video accessories, can collect and preserve 
   the image, with computers and specialized metallographic analysis software 
   can analysis the metallographic image.
■ Easy to operate, Have all kinds of accessories. Widely used in teaching and
   research metallographic analysis, semiconductor silicon wafer inspection,
   geology mineral analysis, precision engineering and surveying fields.
 
Specifications
 

Optical system
Finity color corrected optical system
Viewing head
Gemel trinocular，45°inclined，Diopter adjustment ±5 for each side，Interpupillary distance adjustable between：54-75mm，refract rate，binocular:trinocular =80%:20%
Eyepiece
High eyepoint wide field plan eyepiece PL10X/18mm
High eyepoint wide field eyepiece WF15X/13
High eyepoint wide field eyepiece WF20X/10mm
Metallurgical objcetive
LWD plan achromatic metallurgical objective 5X，10X，20X，50X、100X
Nosepiece
Reversed quadruple nosepiece
Reversed quintuple nosepiece
Focusing adjustment
Low position coaxial coarse and fine adjustment. with tightness adjustment.Coarse adjustment range 38 mm；precision of fine adjustment:2um，
stage
Three-ply mechanical stage，area 180mmX155mm，right hand low position control，Moving range:75mm×40mm; Metal stage plate，center hole dia.φ12mm
Illumination system
Reflection Koehler illumination with iris diaphragm and centerable field diaphragm , wide-range voltage 90-240V ，6V/30W halogen bulb(single 3W LED option), with continuous intensity
Polarizing kit
Polarizer and the analyzer can be removed from the optical path, the analyzer can be rotated 360 °.
Photo accessories
Photo tube（with PK mount），photo eyepiece 3.2X
Video accessories
CTV0.5X/1.0X
software
specialized metallographic analysis software